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Precision device for measuring phenomena such as light wavelength, index of refraction etc.;
apparatus consists of a metal base plate (120 x 120 mm, 2 cm thick) with two full mirrors (30 x 30 mm each)
and a half-silvered mirror (50 x 30 mm) mounted on it according to the Michelson configuration.
The position of one of the full mirrors can be adjusted by means of a micrometer screw (micrometer 0 – 10 mm,
vernier 1 / 100 mm) and a lever arm (step-down gear ratio of 1:10), while the other full mirror,
which is fixed, can be inclined by means of two screws; the half-silvered mirror is fixed in place;
the base plate has a hole for mounting round cell DL408-3K in order to measure the index of refraction of gases.
The underside of the base plate has a tapped hole taking a 10-mm threaded support for mounting the device on the optics bench; supplied with a solid plastic hood in order to protect all optical parts.
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